SPSMS/LaTEQS, UMR-E, CEA-INAC, Grenoble, France.
Phys Rev Lett. 2011 Aug 12;107(7):077005. doi: 10.1103/PhysRevLett.107.077005.
We present measurements of current noise and cross correlations in three-terminal superconductor-normal-metal-superconductor (S-N-S) nanostructures that are potential solid-state entanglers thanks to Andreev reflections at the N-S interfaces. The noise-correlation measurements spanned from the regime where electron-electron interactions are relevant to the regime of incoherent multiple Andreev reflection. In the latter regime, negative cross correlations are observed in samples with closely spaced junctions.
我们呈现了三端超导-正常金属-超导（S-N-S）纳米结构中电流噪声和交叉相关的测量结果，这些结构由于在 N-S 界面处的安德烈夫反射而成为潜在的固态纠缠源。噪声相关测量涵盖了电子-电子相互作用相关的区域以及非相干多次安德烈夫反射的区域。在后一区域中，在结间距较小的样品中观察到了负交叉相关。
