Department of Physics and Astronomy, University of Sheffield , Hicks Building, Hounsfield Road, Sheffield, S3 7RH, UK.
Nano Lett. 2011 Oct 12;11(10):4275-81. doi: 10.1021/nl202269n. Epub 2011 Sep 16.
We use helium ion microscopy (HeIM) to image the nanostructure of poly(3-hexylthiophene)/[6,6]-phenyl-C(61)-butric acid methyl ester (P3HT/PCBM) blend thin-films. Specifically, we study a blend thin-film subject to a thermal anneal at 140 °C and use a plasma-etching technique to gain access to the bulk of the blend thin-films. We observe a domain structure within the bulk of the film that is not apparent at the film-surface and tentatively identify a network of slightly elongated PCBM domains having a spatial periodicity of (20 ± 4) nm a length of (12 ± 8) nm.
我们使用氦离子显微镜（HeIM）来成像聚（3-己基噻吩）/[6,6]-苯基-C（61）-丁酸甲酯（P3HT/PCBM）共混薄膜的纳米结构。具体来说，我们研究了在 140°C 下进行热退火的共混薄膜，并使用等离子体刻蚀技术来获得共混薄膜的大部分。我们观察到薄膜内部存在一个在薄膜表面不明显的畴结构，并初步确定存在一个略微拉长的 PCBM 畴的网络，其空间周期性为（20±4）nm，长度为（12±8）nm。
