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基于矩形二氧化硅微光纤的超高灵敏度折射率传感器。

Ultrasensitive refractive-index sensors based on rectangular silica microfibers.

机构信息

Institute of Photonics Technology, Jinan University, Guangzhou, China.

出版信息

Opt Lett. 2011 Sep 15;36(18):3593-5. doi: 10.1364/OL.36.003593.

Abstract

We demonstrate an ultrasensitive refractive-index (RI) sensor utilizing the polarimetric interference of a rectangular silica microfiber. The measured sensitivity is as high as 18,987 nm/RIU (refractive-index unit) around the RI of 1.33, which is 1 order of magnitude higher than that of the previously reported microfiber devices. Theoretical analysis reveals that such high sensitivity not only is originated from the RI-induced birefringence variation but also relies on the unique birefringence dispersion property for the rectangular microfiber. We predict that the sensitivity can be enhanced significantly when the group birefringence approaches zero.

摘要

我们展示了一种利用矩形二氧化硅微光纤的偏振干涉的超高灵敏度折射率(RI)传感器。在 RI 为 1.33 左右的情况下,测量灵敏度高达 18,987nm/RIU(折射率单位),比以前报道的微光纤器件高出一个数量级。理论分析表明,这种高灵敏度不仅源于 RI 引起的双折射变化,还依赖于矩形微光纤的独特双折射色散特性。我们预测,当群双折射接近零时,灵敏度可以显著增强。

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