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由 C60 的共振非弹性软 X 射线散射图谱探测的芯能级谱中的电子-空穴相关效应。

Electron-hole correlation effects in core-level spectroscopy probed by the resonant inelastic soft x-ray scattering map of C60.

机构信息

Universität Würzburg, Experimentelle Physik VII, Am Hubland, 97074 Würzburg, Germany.

出版信息

J Chem Phys. 2011 Sep 14;135(10):104705. doi: 10.1063/1.3633953.

Abstract

We have employed a unique spectroscopic approach, a resonant inelastic soft x-ray scattering (RIXS) map, to identify and separate electron-hole correlation effects in core-level spectroscopy. With this approach, we are able to derive a comprehensive picture of the electronic structure, separating ground state properties (such as the HOMO-LUMO separation) from excited state properties (such as the C 1s core-exciton binding energy of C(60)). In particular, our approach allows us to determine the difference between core- and valence exciton binding energies in C(60) [0.5 (±0.2) eV]. Furthermore, the RIXS map gives detailed insight into the symmetries of the intermediate and final states of the RIXS process.

摘要

我们采用了一种独特的光谱方法,即共振非弹性软 X 射线散射(RIXS)图谱,来识别和分离核心能级光谱中的电子-空穴相关效应。通过这种方法,我们能够得出电子结构的全面图像,将基态性质(如 HOMO-LUMO 分离)与激发态性质(如 C(60)的 C 1s 芯激子结合能)区分开来。特别是,我们的方法允许我们确定 C(60)中芯激子和价激子结合能的差异[0.5(±0.2)eV]。此外,RIXS 图谱详细揭示了 RIXS 过程中中间和最终态的对称性。

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