RIKEN (The Institute of Physical and Chemical Research), Wako, Saitama 351-0198, Japan.
Phys Rev Lett. 2011 Sep 30;107(14):147401. doi: 10.1103/PhysRevLett.107.147401.
In situ element-specific observation of electronic states of organic films beneath metal electrodes is achieved by x-ray absorption spectroscopy (XAS) in the bulk-sensitive fluorescence-yield (FY) mode. The molecular orientation in Au-covered oligo-thiophene films is confirmed by the C K-edge FY-XAS spectra and the applied bias dependence of the spectra is successfully detected for the first time. The present method can give deeper insights into the electronic-state investigation of various real-device systems under operational conditions.
通过 X 射线吸收光谱（XAS）在体敏感荧光产额（FY）模式下，实现了对金属电极下有机薄膜中电子态的原位元素特异性观察。通过 C K 边 FY-XAS 光谱证实了 Au 覆盖的低聚噻吩薄膜中的分子取向，并且首次成功检测到光谱的外加偏压依赖性。本方法可以深入了解各种实际器件系统在工作条件下的电子态研究。
