3M Corporate Research Analytical Laboratory, 201-2S-16 3M Center, St. Paul, Minnesota 55144, USA.
Anal Chem. 2012 Feb 7;84(3):1744-53. doi: 10.1021/ac203229m. Epub 2012 Jan 25.
Good mass resolution can be difficult to achieve in time-of-flight secondary ion mass spectrometry (TOF-SIMS) when the analysis area is large or when the surface being analyzed is rough. In most cases, a significant improvement in mass resolution can be achieved by postacquisition processing of raw data. Methods are presented in which spectra are extracted from smaller regions within the original analysis area, recalibrated, and selectively summed to produce spectra with higher mass resolution than the original. No hardware modifications or specialized instrument tuning are required. The methods can be extended to convert the original raw file into a new raw file containing high mass resolution data. To our knowledge, this is the first report of conversion of a low mass resolution raw file into a high mass resolution raw file using only the data contained within the low mass resolution raw file. These methods are applicable to any material but are expected to be particularly useful in analysis of difficult samples such as fibers, powders, and freeze-dried biological specimens.
当分析区域较大或被分析表面较粗糙时，飞行时间二次离子质谱（TOF-SIMS）很难实现高质量分辨率。在大多数情况下，通过对原始数据进行后期处理可以显著提高质量分辨率。本文提出了从原始分析区域内较小区域提取光谱、重新校准并选择性地进行总和，以生成比原始光谱具有更高质量分辨率的光谱的方法。这些方法不需要硬件修改或专门的仪器调整。该方法可以扩展到将原始原始文件转换为包含高质量分辨率数据的新原始文件。据我们所知，这是首次仅使用低质量分辨率原始文件中包含的数据将低质量分辨率原始文件转换为高质量分辨率原始文件的报告。这些方法适用于任何材料，但预计在分析纤维、粉末和冻干生物标本等困难样品时特别有用。
