Meng L J, Li Nan, La Riviere P J
Department of Nuclear Plasma and radiological Engineering, University of Illinois at Urbana-Champaign.
IEEE Trans Nucl Sci. 2011 Dec;58(6):3359-3369. doi: 10.1109/TNS.2011.2167632.
This paper presents a feasibility study for using two new imaging geometries for synchrotron X-ray fluorescence emission tomography (XFET) applications. In the proposed approaches, the object is illuminated with synchrotron X-ray beams of various cross-sectional dimensions. The resultant fluorescence photons are detected by high-resolution imaging-spectrometers coupled to collimation apertures. To verify the performance benefits of the proposed methods over the conventional line-by-line scanning approach, we have used both Monte Carlo simulations and an analytical system performance index to compare several different imaging geometries. This study has demonstrated that the proposed XFET approach could lead to a greatly improved imaging speed, which is critical for making XFET a practical imaging modality for a wide range of applications.
本文介绍了一项关于将两种新的成像几何结构用于同步加速器X射线荧光发射断层扫描（XFET）应用的可行性研究。在所提出的方法中，用具有不同横截面尺寸的同步加速器X射线束照射物体。通过与准直孔径耦合的高分辨率成像光谱仪检测产生的荧光光子。为了验证所提出的方法相对于传统逐行扫描方法的性能优势，我们使用了蒙特卡罗模拟和一个分析系统性能指标来比较几种不同的成像几何结构。这项研究表明，所提出的XFET方法可以大大提高成像速度，这对于使XFET成为适用于广泛应用的实用成像方式至关重要。
