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磁共振安全:医疗设备射频加热的快速 T₁测温。

MR safety: fast T₁ thermometry of the RF-induced heating of medical devices.

机构信息

Research Center for Magnetic Resonance Bavaria e.V., Würzburg, Germany.

出版信息

Magn Reson Med. 2012 Nov;68(5):1593-9. doi: 10.1002/mrm.24171. Epub 2012 Jan 27.

Abstract

Determining the MR compatibility of medical implants and devices is becoming increasingly relevant. In most cases, the heating of conductive implants due to radiefrequency (RF) excitation pulses is measured by fluoroptic temperature sensors in relevant tests for approval. Another common method to determine these heating effects is MR thermometry using the proton resonance frequency. This method gives good results in homogeneous phantoms. However in many cases, technical shortcomings such as susceptibility artifacts prohibit exact proton resonance frequency thermometry near medical implants. Therefore, this work aimed at developing a fast T₁-based method which allows controlled MR-related heating of a medical implant while simultaneously quantifying the spatial and temporal temperature distribution. To this end, an inversion recovery snapshot Fast Low-Angle Shot (FLASH) sequence was modified with additional off-resonant heating pulses. With an accelerated imaging method and a sliding-window technique, every 7.6 s a new temperature map could be generated with a spatial in-plane resolution of 2 mm. The temperature deviation from calculated temperature values to reference fluoroptic probe was found to be smaller than 1 K.

摘要

确定医疗植入物和设备的磁共振兼容性变得越来越重要。在大多数情况下,通过在相关测试中使用荧光温度传感器来测量由于射频 (RF) 激励脉冲引起的导电植入物的加热,以进行批准。另一种常见的方法是使用质子共振频率进行磁共振测温来确定这些加热效果。该方法在均匀的体模中能得到很好的结果。然而,在许多情况下,由于磁化率伪影等技术缺陷,在医疗植入物附近进行精确的质子共振频率测温是不可行的。因此,这项工作旨在开发一种基于快速 T₁的方法,该方法允许在控制磁共振相关加热的同时定量测量医疗植入物的空间和时间温度分布。为此,使用额外的非共振加热脉冲对反转恢复快照快速低角度激发 (FLASH) 序列进行了修改。通过加速成像方法和滑动窗口技术,每隔 7.6 s 就可以生成一个新的温度图,其空间平面分辨率为 2 毫米。发现与计算的温度值与参考荧光探头的温度偏差小于 1 K。

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