Cha Su-Young, Shin Jong Moon, Kim Su Jae, Park Sang Eon, Cho Chae Ryong, Cho Yong Chan, Jeong Se-Young
Department of Nano Fusion Technology, Pusan National University, Miryang, South Korea.
Rev Sci Instrum. 2012 Jan;83(1):013901. doi: 10.1063/1.3677333.
The circuitry and components of a Hall measurement kit were replaced with single-crystal copper (SCC) wires and parts prepared by a novel wire fabrication process. This process preserved the grain-free structure of SCC grown by the Czochralski method. The new kit was used to determine, with greatly improved precision, the electrical coefficients such as carrier density and mobility, establish the reproducibility of the measured values, and define the semiconductor type. The observed reduction in electrical signal losses and distortion has been attributed to grain boundary elimination.
霍尔测量套件的电路和组件被单晶铜（SCC）导线以及通过一种新型导线制造工艺制备的部件所取代。该工艺保留了通过提拉法生长的SCC的无晶粒结构。新套件用于以大大提高的精度确定诸如载流子密度和迁移率等电学系数，确定测量值的可重复性，并定义半导体类型。观察到的电信号损耗和失真的减少归因于晶界的消除。
