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采用 C60(+) - Ar(+)共溅射离子化的动态二次离子质谱 (D-SIMS) 平行检测、定量和深度剖析肽。

Parallel detection, quantification, and depth profiling of peptides with dynamic-secondary ion mass spectrometry (D-SIMS) ionized by C60(+)-Ar(+) co-sputtering.

机构信息

Department of Materials Science and Engineering, National Taiwan University, Taipei 106, Taiwan.

出版信息

Anal Chim Acta. 2012 Mar 9;718:64-9. doi: 10.1016/j.aca.2011.12.064. Epub 2012 Jan 8.

DOI:10.1016/j.aca.2011.12.064
PMID:22305899
Abstract

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) using pulsed C(60)(+) primary ions is a promising technique for analyzing biological specimens with high surface sensitivities. With molecular secondary ions of high masses, multiple molecules can be identified simultaneously without prior separation or isotope labeling. Previous reports using the C(60)(+) primary ion have been based on static-SIMS, which makes depth profiling complicated. Therefore, a dynamic-SIMS technique is reported here. Mixed peptides in the cryoprotectant trehalose were used as a model for evaluating the parameters that lead to the parallel detection and quantification of biomaterials. Trehalose was mixed separately with different concentrations of peptides. The peptide secondary ion intensities (normalized with respect to those of trehalose) were directly proportional to their concentration in the matrix (0.01-2.5 mol%). Quantification curves for each peptide were generated by plotting the percentage of peptides in trehalose versus the normalized SIMS intensities. Using these curves, the parallel detection, identification, and quantification of multiple peptides was achieved. Low energy Ar(+) was used to co-sputter and ionize the peptide-doped trehalose sample to suppress the carbon deposition associated with C(60)(+) bombardment, which suppressed the ion intensities during the depth profiling. This co-sputtering technique yielded steadier molecular ion intensities than when using a single C(60)(+) beam. In other words, co-sputtering is suitable for the depth profiling of thick specimens. In addition, the smoother surface generated by co-sputtering yielded greater depth resolution than C(60)(+) sputtering. Furthermore, because C(60)(+) is responsible for generating the molecular ions, the dosage of the auxiliary Ar(+) does not significantly affect the quantification curves.

摘要

飞行时间二次离子质谱(ToF-SIMS)使用脉冲 C(60)(+) 初级离子,是一种具有高表面灵敏度的分析生物标本的很有前途的技术。利用高质量的分子二次离子,可以同时识别多个分子,而无需事先分离或同位素标记。以前使用 C(60)(+) 初级离子的报告都是基于静态 SIMS,这使得深度剖析变得复杂。因此,本文报道了一种动态 SIMS 技术。在海藻糖中混合的肽用作评估导致同时平行检测和定量生物材料的参数的模型。海藻糖分别与不同浓度的肽混合。肽的二次离子强度(相对于海藻糖的强度归一化)与基质中肽的浓度(0.01-2.5mol%)成正比。通过绘制海藻糖中肽的百分比与归一化 SIMS 强度之间的关系,生成了每种肽的定量曲线。使用这些曲线,实现了多种肽的平行检测、鉴定和定量。低能 Ar(+) 用于共溅射和电离肽掺杂的海藻糖样品,以抑制与 C(60)(+) 轰击相关的碳沉积,这抑制了深度剖析过程中的离子强度。与使用单个 C(60)(+) 束相比,这种共溅射技术产生了更稳定的分子离子强度。换句话说,共溅射适用于厚标本的深度剖析。此外,共溅射产生的更平滑的表面比 C(60)(+) 溅射产生的深度分辨率更高。此外,由于 C(60)(+) 负责产生分子离子,辅助 Ar(+) 的剂量不会显著影响定量曲线。

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