Faculty of Engineering Sciences, Djillali Liabes University of Sidi Bel Abbes, Algeria.
Opt Lett. 2012 Feb 15;37(4):449-51. doi: 10.1364/OL.37.000449.
We propose the use of a pattern search optimization technique in combination with a seed preprocessing procedure to determine the optical constants and thickness of thin films using only the transmittance spectra. The approach is quite flexible, straightforward to implement, and efficient in reaching the best fitting. We demonstrate the effectiveness of the method in extracting optical constants, even when the films are not displaying interference fringes. Comparison to a real-coded genetic algorithm shows that the modified pattern search is fast, almost accurate, and does not need any parameter adjustments. The approach is successfully applied to extract the thickness and optical constants of spray pyrolyzed nanocrystalline CdO thin films.
我们提出使用模式搜索优化技术结合种子预处理程序，仅使用透射谱确定薄膜的光学常数和厚度。该方法非常灵活，易于实现，并且在达到最佳拟合方面效率很高。我们证明了该方法在提取光学常数方面的有效性，即使薄膜不显示干涉条纹也是如此。与实码遗传算法的比较表明，改进的模式搜索速度快、几乎准确，并且不需要任何参数调整。该方法成功地应用于提取喷雾热解纳米晶 CdO 薄膜的厚度和光学常数。
