Nehmetallah G, Aylo R, Powers P, Sarangan A, Gao J, Li H, Achari A, Banerjee P P
Electro-Optics Program, University of Dayton, Dayton, Ohio 45469, USA.
Opt Express. 2012 Mar 26;20(7):7095-100. doi: 10.1364/OE.20.007095.
The fabrication and characterization of a novel metamaterial that shows negative index in the visible (blue) is reported. The real part of the negative index of this metamaterial at 405 nm, comprising co-sputtered SiC + Ag nanoparticle mixture on a glass substrate, is deduced from results of double Michelson interferometry setup which shows a negative phase delay. It is numerically verified that this metamaterial can yield near-field super-resolution imaging for both TE and TM polarizations.
报道了一种在可见光(蓝光)波段呈现负折射率的新型超材料的制备与表征。这种超材料由在玻璃衬底上共溅射的碳化硅+银纳米颗粒混合物组成,其在405纳米处负折射率的实部是通过双迈克尔逊干涉测量装置的结果推导得出的,该装置显示出负相位延迟。通过数值验证,这种超材料对TE和TM偏振都能实现近场超分辨率成像。