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钾通道中的电压传感器失活

Voltage sensor inactivation in potassium channels.

作者信息

Bähring Robert, Barghaan Jan, Westermeier Regina, Wollberg Jessica

机构信息

Institut für Zelluläre und Integrative Physiologie, Zentrum für Experimentelle Medizin, Universitätsklinikum Hamburg-Eppendorf Hamburg, Germany.

出版信息

Front Pharmacol. 2012 May 23;3:100. doi: 10.3389/fphar.2012.00100. eCollection 2012.

Abstract

In voltage-gated potassium (Kv) channels membrane depolarization causes movement of a voltage sensor domain. This conformational change of the protein is transmitted to the pore domain and eventually leads to pore opening. However, the voltage sensor domain may interact with two distinct gates in the pore domain: the activation gate (A-gate), involving the cytoplasmic S6 bundle crossing, and the pore gate (P-gate), located externally in the selectivity filter. How the voltage sensor moves and how tightly it interacts with these two gates on its way to adopt a relaxed conformation when the membrane is depolarized may critically determine the mode of Kv channel inactivation. In certain Kv channels, voltage sensor movement leads to a tight interaction with the P-gate, which may cause conformational changes that render the selectivity filter non-conductive ("P/C-type inactivation"). Other Kv channels may preferably undergo inactivation from pre-open closed-states during voltage sensor movement, because the voltage sensor temporarily uncouples from the A-gate. For this behavior, known as "preferential" closed-state inactivation, we introduce the term "A/C-type inactivation". Mechanistically, P/C- and A/C-type inactivation represent two forms of "voltage sensor inactivation."

摘要

在电压门控钾(Kv)通道中,膜去极化会导致电压传感结构域发生移动。蛋白质的这种构象变化会传递到孔道结构域,并最终导致孔道开放。然而,电压传感结构域可能会与孔道结构域中的两个不同门控相互作用:激活门控(A门控),涉及胞质侧S6束的穿越;以及孔道门控(P门控),位于外部的选择性过滤器中。当膜去极化时,电压传感器如何移动以及在其转变为松弛构象的过程中与这两个门控的相互作用有多紧密,可能会决定性地决定Kv通道失活的模式。在某些Kv通道中,电压传感器的移动会导致与P门控紧密相互作用,这可能会引起构象变化,使选择性过滤器失去传导性(“P/C型失活”)。其他Kv通道可能在电压传感器移动期间更倾向于从预开放的关闭状态发生失活,因为电压传感器会暂时与A门控解偶联。对于这种被称为“优先”关闭状态失活的行为,我们引入术语“A/C型失活”。从机制上讲,P/C型和A/C型失活代表了两种形式的“电压传感器失活”。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1559/3358694/c83800029f16/fphar-03-00100-g001.jpg

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