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利用角分辨光电子能谱测量拓扑绝缘体 Bi2Se3 表面极弱的电子-声子耦合。

Measurement of an exceptionally weak electron-phonon coupling on the surface of the topological insulator Bi2Se3 using angle-resolved photoemission spectroscopy.

机构信息

Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, New York 11973, USA.

出版信息

Phys Rev Lett. 2012 May 4;108(18):187001. doi: 10.1103/PhysRevLett.108.187001. Epub 2012 May 3.

Abstract

Gapless surface states on topological insulators are protected from elastic scattering on nonmagnetic impurities which makes them promising candidates for low-power electronic applications. However, for widespread applications, these states should have to remain coherent at ambient temperatures. Here, we studied temperature dependence of the electronic structure and the scattering rates on the surface of a model topological insulator, Bi2Se3, by high-resolution angle-resolved photoemission spectroscopy. We found an extremely weak broadening of the topological surface state with temperature and no anomalies in the state's dispersion, indicating exceptionally weak electron-phonon coupling. Our results demonstrate that the topological surface state is protected not only from elastic scattering on impurities, but also from scattering on low-energy phonons, suggesting that topological insulators could serve as a basis for room-temperature electronic devices.

摘要

拓扑绝缘体的无间隙表面态不受非磁性杂质的弹性散射的影响,这使得它们成为低功耗电子应用的有前途的候选者。然而,为了广泛应用,这些状态应该在环境温度下保持相干。在这里,我们通过高分辨率角分辨光发射光谱研究了模型拓扑绝缘体 Bi2Se3 表面的电子结构和散射率随温度的变化。我们发现拓扑表面态随温度的展宽非常弱,且在状态色散中没有异常,这表明电子-声子耦合非常弱。我们的结果表明,拓扑表面态不仅受到杂质弹性散射的保护,而且受到低能声子散射的保护,这表明拓扑绝缘体可以作为室温电子器件的基础。

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