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多孔硅纳米结构的光阱减少。

Porosification-reduced optical trapping of silicon nanostructures.

机构信息

Department of Physics, Institute of Advanced Materials (IAM), Hong Kong Baptist University (HKBU), 224 Waterloo Road, Kowloon Tong, Hong Kong SAR, People's Republic of China.

出版信息

Nanoscale. 2012 Sep 28;4(19):5835-9. doi: 10.1039/c2nr31680c. Epub 2012 Aug 16.

Abstract

Metal-assisted chemical etching (MACE) was carried out to fabricate solid silicon nanowires (s-SiNWs) and mesoporous silicon nanowires (mp-SiNWs). Total reflection and transmission were measured using an integrated sphere to study optical properties of the MACE-generated silicon nanostructures. Without NW aggregation, mp-SiNWs vertically standing on a mesoporous silicon layer trap less light than s-SiNWs over a wavelength range of 400-800 nm, owing to porosification-enhanced optical scattering from the rough inner surfaces of the mesoporous silicon skeletons. Porosification substantially weakens the NW mechanical strength; hence the elongated mp-SiNWs aggregate after 30 min etching and deteriorate optical trapping.

摘要

采用金属辅助化学刻蚀(MACE)工艺制备了体硅纳米线(s-SiNWs)和介孔硅纳米线(mp-SiNWs)。利用积分球对全反射和全透射进行了测量,以研究 MACE 生成的硅纳米结构的光学性质。在没有纳米线聚集的情况下,介孔硅层上垂直排列的 mp-SiNWs 在 400-800nm 的波长范围内比 s-SiNWs 捕获的光少,这是由于粗糙的介孔硅骨架内表面增强了多孔硅的光学散射。多孔化显著削弱了纳米线的机械强度;因此,在 30 分钟刻蚀后,细长的 mp-SiNWs 会聚集,从而降低光捕获效率。

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