Department of Mechanical Engineering, Northwestern University, 2145 Sheridan Rd., Evanston, IL 60208-3111, USA.
Small. 2012 Nov 5;8(21):3233-52. doi: 10.1002/smll.201200342. Epub 2012 Aug 20.
The emergence of one-dimensional nanostructures as fundamental constituents of advanced materials and next-generation electronic and electromechanical devices has increased the need for their atomic-scale characterization. Given its spatial and temporal resolution, coupled with analytical capabilities, transmission electron microscopy (TEM) has been the technique of choice in performing atomic structure and defect characterization. A number of approaches have been recently developed to combine these capabilities with in-situ mechanical deformation and electrical characterization in the emerging field of in-situ TEM electromechanical testing. This has enabled researchers to establish unambiguous synthesis-structure-property relations for one-dimensional nanostructures. In this article, the development and latest advances of several in-situ TEM techniques to carry out mechanical and electromechanical testing of nanowires and nanotubes are reviewed. Through discussion of specific examples, it is shown how the merging of several microsystems and TEM has led to significant insights into the behavior of nanowires and nanotubes, underscoring the significant role in-situ techniques play in the development of novel nanoscale systems and materials.
一维纳米结构作为先进材料和下一代电子及机电设备的基本组成部分的出现，增加了对其原子尺度特性进行描述的需求。鉴于透射电子显微镜（TEM）具有空间和时间分辨率，以及分析能力，它一直是进行原子结构和缺陷特性描述的首选技术。最近已经开发出了许多方法，将这些能力与新兴的原位 TEM 电子机械测试领域中的原位机械变形和电特性相结合。这使研究人员能够为一维纳米结构建立明确的合成-结构-性能关系。本文综述了几种原位 TEM 技术的发展和最新进展，这些技术可用于对纳米线和纳米管进行机械和机电测试。通过讨论具体实例，展示了将多个微系统与 TEM 相结合如何导致对纳米线和纳米管行为的深入了解，强调了原位技术在新型纳米系统和材料开发中的重要作用。
