Wang C D, Jha S K, Chen Z H, Ng T W, Liu Y K, Yuen M F, Lu Z Z, Kwok S Y, Zapien J A, Bello I, Lee C S, Zhang W J
Center of Super-Diamond and Advanced Films (COSDAF) and Department of Physics and Materials Science, City University of Hong Kong, Hong Kong SAR, China.
J Nanosci Nanotechnol. 2012 Jun;12(6):4560-3. doi: 10.1166/jnn.2012.6211.
Vertically-aligned ZnO nanorods (NRs) arrays were synthesized by a low-temperature solution method on boron-doped diamond (BDD) films. The morphology, growth direction, and crystallinity of the ZnO NRs were studied by scanning electron microscopy, X-ray diffraction and cathodoluminescence. Electrical characterization of the ZnO NR/BBD heterostructures revealed characteristic p-n junction properties with an on/off ratio of about 50 at +/- 4 V and a small reverse leakage current approximately 1 microA. Moreover, the junctions showed an ideality factor around 1.0 at a low forward voltage from 0 to 0.3 V and about 2.1 for an increased voltage ranging from 1.2 to 3.0 V, being consistent with that of an ideal diode according to the Sah-Noyce-Shockley theory.
通过低温溶液法在硼掺杂金刚石(BDD)薄膜上合成了垂直排列的氧化锌纳米棒(NRs)阵列。通过扫描电子显微镜、X射线衍射和阴极发光研究了氧化锌纳米棒的形貌、生长方向和结晶度。氧化锌纳米棒/硼掺杂金刚石异质结构的电学特性显示出典型的p-n结特性,在±4 V时开/关比约为50,反向漏电流小,约为1微安。此外,根据Sah-Noyce-Shockley理论,这些结在0至0.3 V的低正向电压下理想因子约为1.0,在1.2至3.0 V的升高电压下约为2.1,与理想二极管的情况一致。