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通过图案转移工艺在厚度可控的柔性衬底上制备的碳纳米管阵列的场发射特性

Field emission properties of carbon nanotube arrays on the thickness-controlled flexible substrate by the pattern transfer process.

作者信息

Chang Chia-Tsung, Juan Chuan-Ping, Lin Yi-Chan, Li Yu-Ren, Tsai Wan-Lin, Yang Po-Yu, Lee I-Che, Cheng Huang-Chung

机构信息

Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, Hsinchu, Taiwan 300, ROC.

出版信息

J Nanosci Nanotechnol. 2012 Jul;12(7):5742-6. doi: 10.1166/jnn.2012.6241.

Abstract

A technigal with the polydimethylsiloxane (PDMS) solution infiltrated into the SiOx-coated CNTAs has been utilized to directly transfer the CNTAs away from the silicon substrate. The oxide coating layer was utilized to protect the morpholgy of as-grown patterned vertical aligmed carbon nanotube (CNTs) arrays. The high density plasma reactive ions etching (HDP-RIE) system was used to make the CNTs emerge from the surface of the flexible substrate and modify the crystallines of CNTs. After the protecting oxide was HDP-RIE-processed for 8 min, the emission current properties were enhanced to be 1.03 V/microm and 1.43 V/microm, respectively, for the turn-on field and the threshold field, as compared with 1.25 V/microm and 1.59 V/microm for the as-grown CNTs, accordingly. The Field Emission (FE) enhancement after dry etching could be attributed to the open-ended structures and better crystalline.

摘要

一种将聚二甲基硅氧烷(PDMS)溶液渗透到涂有SiO x的碳纳米管阵列(CNTAs)中的技术已被用于直接将CNTAs从硅衬底上转移下来。氧化物涂层用于保护生长的图案化垂直排列碳纳米管(CNTs)阵列的形态。高密度等离子体反应离子蚀刻(HDP-RIE)系统用于使CNTs从柔性衬底表面露出并改变CNTs的晶体结构。在对保护氧化物进行8分钟的HDP-RIE处理后,开启场和阈值场的发射电流特性分别提高到1.03 V/μm和1.43 V/μm,相比之下,生长态CNTs的开启场和阈值场分别为1.25 V/μm和1.59 V/μm。干蚀刻后场发射(FE)的增强可归因于开口结构和更好的结晶性。

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