Chang Chia-Tsung, Juan Chuan-Ping, Lin Yi-Chan, Li Yu-Ren, Tsai Wan-Lin, Yang Po-Yu, Lee I-Che, Cheng Huang-Chung
Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, Hsinchu, Taiwan 300, ROC.
J Nanosci Nanotechnol. 2012 Jul;12(7):5742-6. doi: 10.1166/jnn.2012.6241.
A technigal with the polydimethylsiloxane (PDMS) solution infiltrated into the SiOx-coated CNTAs has been utilized to directly transfer the CNTAs away from the silicon substrate. The oxide coating layer was utilized to protect the morpholgy of as-grown patterned vertical aligmed carbon nanotube (CNTs) arrays. The high density plasma reactive ions etching (HDP-RIE) system was used to make the CNTs emerge from the surface of the flexible substrate and modify the crystallines of CNTs. After the protecting oxide was HDP-RIE-processed for 8 min, the emission current properties were enhanced to be 1.03 V/microm and 1.43 V/microm, respectively, for the turn-on field and the threshold field, as compared with 1.25 V/microm and 1.59 V/microm for the as-grown CNTs, accordingly. The Field Emission (FE) enhancement after dry etching could be attributed to the open-ended structures and better crystalline.
一种将聚二甲基硅氧烷(PDMS)溶液渗透到涂有SiO x的碳纳米管阵列(CNTAs)中的技术已被用于直接将CNTAs从硅衬底上转移下来。氧化物涂层用于保护生长的图案化垂直排列碳纳米管(CNTs)阵列的形态。高密度等离子体反应离子蚀刻(HDP-RIE)系统用于使CNTs从柔性衬底表面露出并改变CNTs的晶体结构。在对保护氧化物进行8分钟的HDP-RIE处理后,开启场和阈值场的发射电流特性分别提高到1.03 V/μm和1.43 V/μm,相比之下,生长态CNTs的开启场和阈值场分别为1.25 V/μm和1.59 V/μm。干蚀刻后场发射(FE)的增强可归因于开口结构和更好的结晶性。