Institute of Semiconductor Physics SB RAS, Novosibirsk, Russia.
Langmuir. 2012 Oct 2;28(39):13793-7. doi: 10.1021/la302907r. Epub 2012 Sep 17.
It is shown that an increase in the amplitude of QCM shear oscillations during frequency scanning around the resonance frequency is accompanied (at a definite voltage) by distortions in the amplitude-frequency dependence for QCM. We demonstrated that these distortions are connected to the rupture of macromolecules from the QCM surface. It is shown that the identification of the rupture of particles and macromolecules from the QCM surface can be carried out by relying on the analysis of these distortions of the amplitude-frequency dependence. The distortions were distinguished as a signal. The number of broken bonds can be estimated from the value of this distortion signal, and the threshold voltage applied to the system can be used to estimate the rupture force to high accuracy. Using the proposed method, we estimated the strength of a physical bond, which was 3 pN. This procedure can be useful for studying biological objects and represents an advanced step in the development of the REVS (rupture event scanning) technique.
研究表明，在共振频率附近的频率扫描过程中，QCM 切向振荡的振幅增加会伴随着 QCM 的振幅-频率关系发生畸变（在一定电压下）。我们证明了这些畸变与从 QCM 表面断裂的大分子有关。结果表明，可以通过分析这种振幅-频率关系的畸变来识别从 QCM 表面破裂的粒子和大分子。将这些畸变区分出来作为一个信号。可以根据该畸变信号的值来估计断裂键的数量，并且可以通过施加到系统上的阈值电压来高精度地估计断裂力。使用所提出的方法，我们估计了物理键的强度，约为 3 pN。该方法可用于研究生物对象，是 REVS（破裂事件扫描）技术的一个重要发展。
