State Key Laboratory of Polymer Physics and Chemistry, Institute of Chemistry, Chinese Academy of Sciences, Beijing, PR China.
Adv Mater. 2012 Dec 11;24(47):6335-41. doi: 10.1002/adma.201202855. Epub 2012 Sep 19.
For the PDPP3T/PCBM system investigated here, atomic force microscopy, resonant soft X-ray scattering, and grazing incidence wide angle X-ray scattering are used as an initial set of tools to determine the surface texture, the bulk compositional morphology, and the crystallization behavior, respectively. We find systematic variations and relate them to device performance. A solvent mixture of DCB/CF/DIO = 76:19:5 (v/v/v) yields a PCE of 6.71%.
对于这里研究的 PDPP3T/PCBM 体系，原子力显微镜、共振软 X 射线散射和掠入射广角 X 射线散射分别被用作确定表面织构、体相组成形态和结晶行为的初始工具。我们发现了系统的变化并将其与器件性能相关联。采用 DCB/CF/DIO = 76:19:5（体积比/体积比/体积比）的溶剂混合物可得到 6.71%的 PCE。
