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外延 Bi2Se3 薄膜输运性质中的拓扑保护的表现。

Manifestation of topological protection in transport properties of epitaxial Bi2Se3 thin films.

机构信息

Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Osaka 567-0047, Japan.

出版信息

Phys Rev Lett. 2012 Aug 10;109(6):066803. doi: 10.1103/PhysRevLett.109.066803. Epub 2012 Aug 9.

Abstract

The massless Dirac fermions residing on the surface of three-dimensional topological insulators are protected from backscattering and cannot be localized by disorder, but such protection can be lifted in ultrathin films when the three-dimensionality is lost. By measuring the Shubnikov-de Haas oscillations in a series of high-quality Bi2Se3 thin films, we revealed a systematic evolution of the surface conductance as a function of thickness and found a striking manifestation of the topological protection: The metallic surface transport abruptly diminishes below the critical thickness of ~6 nm, at which an energy gap opens in the surface state and the Dirac fermions become massive. At the same time, the weak antilocalization behavior is found to weaken in the gapped phase due to the loss of π Berry phase.

摘要

在三维拓扑绝缘体表面存在的无质量狄拉克费米子不受背散射的保护,也不会被无序所局域化,但当三维性丧失时,这种保护在超薄薄膜中会被打破。通过在一系列高质量 Bi2Se3 薄膜中测量肖特基德哈斯振荡,我们揭示了表面电导率作为厚度函数的系统演化,并发现了拓扑保护的惊人表现:在临界厚度~6nm 以下,表面态中会出现能隙,狄拉克费米子变得有质量,金属表面输运会突然减少。同时,由于 π 贝里相位的损失,在带隙相中发现弱反局域化行为会减弱。

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