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在经过像差校正的环境透射电子显微镜中观察碳纳米管的氧化。

Observations of carbon nanotube oxidation in an aberration-corrected environmental transmission electron microscope.

机构信息

Stanford Nanocharacterization Laboratory, Stanford University, Stanford, California 94305, United States.

出版信息

ACS Nano. 2013 Mar 26;7(3):2566-72. doi: 10.1021/nn305949h. Epub 2013 Feb 6.

DOI:10.1021/nn305949h
PMID:23360330
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC3609878/
Abstract

We report the first direct study on the oxidation of carbon nanotubes at the resolution of an aberration-corrected environmental transmission electron microscope (ETEM), as we locate and identify changes in the same nanotubes as they undergo oxidation at increasing temperatures in situ in the ETEM. Contrary to earlier reports that CNT oxidation initiates at the end of the tube and proceeds along its length, our findings show that only the outside graphene layer is being removed and, on occasion, the interior inner wall is oxidized, presumably due to oxygen infiltrating into the hollow nanotube through an open end or breaks in the tube. We believe that this work provides the foundation for a greater scientific understanding of the mechanism underlying the nanotube oxidation process, as well as guidelines to manipulate the nanotubes' structure or prevent their oxidation.

摘要

我们报告了首例在具有像差校正功能的环境透射电子显微镜(ETEM)分辨率下对碳纳米管氧化的直接研究,因为我们在原位 ETEM 中定位和识别了随着温度升高而发生氧化的同纳米管的变化。与早期的报告相反,这些报告指出 CNT 氧化始于管的末端并沿其长度进行,我们的发现表明,只有外部的石墨烯层被去除,并且有时内部的内壁被氧化,这可能是由于氧气通过开口端或管中的裂缝渗透到空心纳米管中。我们相信这项工作为更好地理解纳米管氧化过程的机制提供了基础,同时也为操纵纳米管的结构或防止其氧化提供了指导。

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本文引用的文献

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Atomistic description of electron beam damage in nitrogen-doped graphene and single-walled carbon nanotubes.氮掺杂石墨烯和单壁碳纳米管中电子束损伤的原子级描述。
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Image resolution and sensitivity in an environmental transmission electron microscope.环境透射电子显微镜中的图像分辨率和灵敏度。
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