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慢性神经皮层植入物中钨微丝的综合表征

Comprehensive characterization of tungsten microwires in chronic neurocortical implants.

作者信息

Prasad Abhishek, Xue Qing-Shan, Sankar Viswanath, Nishida Toshikazu, Shaw Gerry, Streit Wolfgang, Sanchez Justin C

机构信息

Department of Biomedical Engineering and the Miami Project to Cure Paralysis, University of Miami, Coral Gables, FL 33146, USA.

出版信息

Annu Int Conf IEEE Eng Med Biol Soc. 2012;2012:755-8. doi: 10.1109/EMBC.2012.6346041.

DOI:10.1109/EMBC.2012.6346041
PMID:23366002
Abstract

The long-term performance of chronic microelectrode array implants for neural ensemble recording is affected by temporal degradation in signal quality due to several factors including structural changes in the recording surface, electrical responses, and tissue immune reactivity. This study combines the information available from the temporal aggregation of both biotic and abiotic metrics to analyze and quantify the combined effects on long-term performance. Study of a 42-day implant showed there was a functional relationship between the measured impedance and the array neuronal yield. This was correlated with structural changes in the recording sites, microglial activation/degeneration, and elevation of a blood biochemical marker for axonal injury. We seek to elucidate the mechanisms of chronic microelectrode array failure through the study of the combined effects of these biotic and abiotic factors.

摘要

用于神经群体记录的慢性微电极阵列植入物的长期性能会受到信号质量随时间退化的影响,这是由多种因素造成的,包括记录表面的结构变化、电反应和组织免疫反应性。本研究结合了生物和非生物指标随时间累积的可用信息,以分析和量化对长期性能的综合影响。一项为期42天的植入物研究表明,测量的阻抗与阵列神经元产量之间存在功能关系。这与记录部位的结构变化、小胶质细胞激活/退化以及轴突损伤的血液生化标志物升高有关。我们试图通过研究这些生物和非生物因素的综合影响来阐明慢性微电极阵列失效的机制。

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