Department of Physics, University of Siegen, 57068 Siegen, Germany.
Phys Chem Chem Phys. 2013 Mar 28;15(12):4444-50. doi: 10.1039/c3cp44500c.
Undoped and Mn(2+)-doped CdSe nanowires (NWs) grown by a solution-liquid-solid (SLS) method using Bi nanocatalysts have been studied by X-ray powder diffraction measurements. Except for heavily doped nanowires no measurable changes in nanowire lattice parameters were observed. The lattice parameter of heavily doped nanowires shrinks by about 0.5% compared with the undoped ones, which corresponds to a doping concentration of 1.6%. For the other samples no change in lattice parameter is measured referring to a doping level much below 1%. Real structural parameters of nanowires were found to vary as a function of doping level, such as the zinc blende to wurtzite ratio, the static Debye-Waller factor, axial strain, and the number of stacking faults. Compared with the undoped nanowires the overall perfection is slightly improved for low doping but deteriorates drastically for higher doping. Our results highlight the importance of controlling the dopant concentration during the preparation of doped nanostructures.
采用溶液-液-固(SLS)方法在 Bi 纳米催化剂上生长的未掺杂和 Mn(2+)掺杂的 CdSe 纳米线(NWs)通过 X 射线粉末衍射测量进行了研究。除了严重掺杂的纳米线外,没有观察到纳米线晶格参数的可测量变化。与未掺杂的纳米线相比,严重掺杂的纳米线的晶格参数收缩约 0.5%,这对应于 1.6%的掺杂浓度。对于其他样品,没有测量到晶格参数的变化,这表明掺杂水平远低于 1%。发现纳米线的实际结构参数随掺杂水平而变化,例如闪锌矿到纤锌矿的比例、静态德拜-沃勒因子、轴向应变和堆叠缺陷的数量。与未掺杂的纳米线相比,低掺杂时整体完整性略有提高,但高掺杂时则急剧恶化。我们的结果强调了在制备掺杂纳米结构时控制掺杂浓度的重要性。