Suppr超能文献

掺杂诱导胶体半导体纳米线的结构变化。

Doping induced structural changes in colloidal semiconductor nanowires.

机构信息

Department of Physics, University of Siegen, 57068 Siegen, Germany.

出版信息

Phys Chem Chem Phys. 2013 Mar 28;15(12):4444-50. doi: 10.1039/c3cp44500c.

Abstract

Undoped and Mn(2+)-doped CdSe nanowires (NWs) grown by a solution-liquid-solid (SLS) method using Bi nanocatalysts have been studied by X-ray powder diffraction measurements. Except for heavily doped nanowires no measurable changes in nanowire lattice parameters were observed. The lattice parameter of heavily doped nanowires shrinks by about 0.5% compared with the undoped ones, which corresponds to a doping concentration of 1.6%. For the other samples no change in lattice parameter is measured referring to a doping level much below 1%. Real structural parameters of nanowires were found to vary as a function of doping level, such as the zinc blende to wurtzite ratio, the static Debye-Waller factor, axial strain, and the number of stacking faults. Compared with the undoped nanowires the overall perfection is slightly improved for low doping but deteriorates drastically for higher doping. Our results highlight the importance of controlling the dopant concentration during the preparation of doped nanostructures.

摘要

采用溶液-液-固(SLS)方法在 Bi 纳米催化剂上生长的未掺杂和 Mn(2+)掺杂的 CdSe 纳米线(NWs)通过 X 射线粉末衍射测量进行了研究。除了严重掺杂的纳米线外,没有观察到纳米线晶格参数的可测量变化。与未掺杂的纳米线相比,严重掺杂的纳米线的晶格参数收缩约 0.5%,这对应于 1.6%的掺杂浓度。对于其他样品,没有测量到晶格参数的变化,这表明掺杂水平远低于 1%。发现纳米线的实际结构参数随掺杂水平而变化,例如闪锌矿到纤锌矿的比例、静态德拜-沃勒因子、轴向应变和堆叠缺陷的数量。与未掺杂的纳米线相比,低掺杂时整体完整性略有提高,但高掺杂时则急剧恶化。我们的结果强调了在制备掺杂纳米结构时控制掺杂浓度的重要性。

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验