Solid State Physics, Lund University, Box 118, S-221 00 Lund, Sweden.
Nano Lett. 2013 Mar 13;13(3):903-8. doi: 10.1021/nl303660h. Epub 2013 Feb 19.
By combining in situ and ex situ transmission electron microscopy measurements, we examine the factors that control the morphology of "hybrid" nanowires that include group III-V and group IV materials. We focus on one materials pair, GaP/Si, for which we use a wide range of growth parameters. We show through video imaging that nanowire morphology depends on growth conditions, but that a general pattern emerges where either single kinks or inclined defects form some distance after the heterointerface. We show that pure Si nanowires can be made to exhibit the same kinks and defects by changing their droplet volume. From this we derive a model where droplet geometry drives growth morphology and discuss optimization strategies. We finally discuss morphology control for material pairs where the second material kinks immediately at the heterointerface and show that an interlayer between segments can enable the growth of unkinked hybrid nanowires.
通过结合原位和非原位透射电子显微镜测量,我们研究了控制包括 III-V 族和 IV 族材料的“杂化”纳米线形态的因素。我们专注于一对材料,GaP/Si,为此我们使用了广泛的生长参数。我们通过视频成像表明,纳米线形态取决于生长条件,但出现了一个普遍的模式,即在杂界面后一定距离处形成单个扭结或倾斜缺陷。我们表明,通过改变液滴体积,可以使纯 Si 纳米线表现出相同的扭结和缺陷。由此,我们得出了一个模型,其中液滴几何形状驱动生长形态,并讨论了优化策略。最后,我们讨论了在第二材料立即在杂化界面处发生扭结的材料对的形态控制,并表明在段之间的夹层可以使未扭结的杂化纳米线生长。