Girshovitz Pinhas, Shaked Natan T
Department of Biomedical Engineering, Faculty of Engineering, Tel Aviv University, Tel Aviv 69978, Israel.
Opt Express. 2013 Mar 11;21(5):5701-14. doi: 10.1364/OE.21.005701.
We present a simple-to-align, highly-portable interferometer, which is able to capture wide-field, off-axis interference patterns from transparent samples under low-coherence illumination. This small-dimensions and low-cost device can be connected to the output of a transmission microscope illuminated by a low-coherence source and measure sub-nanometric optical thickness changes in a label-free manner. In contrast to our previously published design, the τ interferometer, the new design is able to fully operate in an off-axis holographic geometry, where the interference fringes have high spatial frequency, and the interference area is limited only by the coherence length of the source, and thus it enables to easily obtain high-quality quantitative images of static and dynamic samples. We present several applications for the new design including nondestructive optical testing of transparent microscopic elements with nanometric thickness and live-cell imaging.
我们展示了一种易于对准、高度便携的干涉仪，它能够在低相干照明下从透明样品中捕获宽视场离轴干涉图案。这种小尺寸、低成本的设备可以连接到由低相干源照明的透射显微镜的输出端，并以无标记方式测量亚纳米级的光学厚度变化。与我们之前发表的τ干涉仪设计相比，新设计能够在离轴全息几何结构中完全运行，其中干涉条纹具有高空间频率，干涉区域仅受光源相干长度的限制，因此它能够轻松获得静态和动态样品的高质量定量图像。我们展示了新设计的几个应用，包括对具有纳米厚度的透明微观元件进行无损光学测试以及活细胞成像。
