定量相位显微镜中几何厚度和折射率的解耦。
Decoupling of geometric thickness and refractive index in quantitative phase microscopy.
机构信息
Biophysics and Physiology Lab, Department of Physics, University of Texas-Arlington, Texas 76019, USA.
出版信息
Opt Lett. 2013 Mar 15;38(6):1007-9. doi: 10.1364/OL.38.001007.
PMID:23503289
Abstract
In quantitative phase imaging, a priori knowledge of either refractive index or physical thickness is used to estimate the change in one of these parameters. Here, we report a method for decoupling geometric thickness from refractive index in quantitative phase microscopy.
摘要
在定量相位成像中，利用折射率或物理厚度的先验知识来估计这些参数之一的变化。在这里，我们报告了一种在定量相显微镜中解耦几何厚度和折射率的方法。
Zotero 插件