Yoshiyama M, Noiri Y, Ozaki K, Uchida A, Ishikawa Y, Ishida H
Department of Operative Dentistry, Tokushima University School of Dentistry, Japan.
J Dent Res. 1990 Jun;69(6):1293-7. doi: 10.1177/00220345900690061401.
Transmission electron microscopy (TEM) and x-ray microanalysis (XMA) were used for the study of the ultrastructure of the lumens of dentinal tubules in superficial layers of dentin specimens obtained by use of a new biopsy technique from both hypersensitive and naturally desensitized areas of exposed root surfaces, in vivo. The TEM images showed clearly that the lumens of most of the tubules were occluded with mineral crystals in naturally desensitized areas, but such lumens were empty and surrounded with peritubular and intertubular dentin in hypersensitive areas. Moreover, electron-dense structures that lined peritubular dentin were observed in the empty lumens of dentinal tubules.
透射电子显微镜（TEM）和X射线微分析（XMA）用于研究通过一种新的活检技术在体内从暴露根面的过敏和自然脱敏区域获取的牙本质标本表层牙本质小管管腔的超微结构。TEM图像清楚地显示，在自然脱敏区域，大多数小管的管腔被矿物晶体阻塞，但在过敏区域，这些管腔是空的，周围是管周和管间牙本质。此外，在牙本质小管的空管腔中观察到了排列在管周牙本质内的电子致密结构。
