Max-Planck-Institut für Mikrostrukturphysik, 06120 Halle, Germany.
Ultramicroscopy. 2013 Jul;130:70-6. doi: 10.1016/j.ultramic.2013.02.022. Epub 2013 Mar 6.
Using a photoelectron emission microscope (PEEM), we demonstrate spin-resolved electron spectroscopic imaging of ultrathin magnetic Co films grown on Cu(100). The spin-filter, based on the spin-dependent reflection of low energy electrons from a W(100) crystal, is attached to an aberration corrected electrostatic energy analyzer coupled to an electrostatic PEEM column. We present a method for the quantitative measurement of the electron spin polarization at 4 × 10³ points of the PEEM image, simultaneously. This approach uses the subsequent acquisition of two images with different scattering energies of the electrons at the W(100) target to directly derive the spin polarization without the need of magnetization reversal of the sample.
使用光电发射显微镜 (PEEM)，我们证明了在 Cu(100) 上生长的超薄 Co 薄膜的自旋分辨电子光谱成像。自旋滤波器基于从 W(100) 晶体反射的低能电子的自旋依赖性，连接到与静电 PEEM 柱耦合的校正像差的静电能分析器。我们提出了一种在 PEEM 图像的 4×10³个点上同时进行电子自旋极化定量测量的方法。该方法使用在 W(100)目标上获取两个具有不同电子散射能量的图像，直接推导出自旋极化，而不需要对样品进行磁化反转。
