Litvinov Julia, Wang Yi-Ju, George Jinnie, Chinwangso Pawilai, Brankovic Stanko, Willson Richard C, Litvinov Dmitri
Biomedical Engineering, University of Houston, Houston, Texas 77204.
Surf Coat Technol. 2013 Jun 15;224:101-108. doi: 10.1016/j.surfcoat.2013.03.006.
This paper describes synthesis of ultrathin pinhole-free insulating aluminum oxide layers for electronic device protection in corrosive liquid environments, such as phosphate buffered saline (PBS) or clinical fluids, to enable emerging biomedical applications such as biomolecular sensors. A pinhole-free 25-nm thick amorphous aluminum oxide layer has been achieved using ultra-high vacuum DC magnetron reactive sputtering of aluminum in oxygen/argon plasma followed by oxygen plasma post-processing. Deposition parameters were optimized to achieve the best corrosion protection of lithographically defined device structures. Electrochemical deposition of copper through the aluminum oxide layers was used to detect the presence (or absence) of pinholes. FTIR, XPS, and spectroscopic ellipsometry were used to characterize the material properties of the protective layers. Electrical resistance of the copper device structures protected by the aluminum oxide layers and exposed to a PBS solution was used as a metric to evaluate the long-term stability of these device structures.
本文描述了用于在腐蚀性液体环境(如磷酸盐缓冲盐水(PBS)或临床流体)中保护电子设备的超薄无针孔绝缘氧化铝层的合成,以实现诸如生物分子传感器等新兴生物医学应用。通过在氧气/氩气等离子体中对铝进行超高真空直流磁控反应溅射,随后进行氧等离子体后处理,获得了厚度为25纳米的无针孔非晶氧化铝层。优化了沉积参数,以实现对光刻定义的器件结构的最佳腐蚀保护。通过氧化铝层进行铜的电化学沉积,以检测针孔的存在(或不存在)。使用傅里叶变换红外光谱(FTIR)、X射线光电子能谱(XPS)和光谱椭偏仪来表征保护层的材料特性。将由氧化铝层保护并暴露于PBS溶液中的铜器件结构的电阻用作评估这些器件结构长期稳定性的指标。