Zhang Fucai, Peterson Isaac, Vila-Comamala Joan, Diaz Ana, Berenguer Felisa, Bean Richard, Chen Bo, Menzel Andreas, Robinson Ian K, Rodenburg John M
London Centre for Nanotechnology, UCL, London, UK.
Opt Express. 2013 Jun 3;21(11):13592-606. doi: 10.1364/OE.21.013592.
Accurate knowledge of translation positions is essential in ptychography to achieve a good image quality and the diffraction limited resolution. We propose a method to retrieve and correct position errors during the image reconstruction iterations. Sub-pixel position accuracy after refinement is shown to be achievable within several tens of iterations. Simulation and experimental results for both optical and X-ray wavelengths are given. The method improves both the quality of the retrieved object image and relaxes the position accuracy requirement while acquiring the diffraction patterns.
在叠层成像术中,准确了解平移位置对于获得良好的图像质量和衍射极限分辨率至关重要。我们提出了一种在图像重建迭代过程中检索和校正位置误差的方法。结果表明,经过几十次迭代后可实现亚像素级的位置精度。给出了光学和X射线波长的模拟和实验结果。该方法在获取衍射图案的同时,提高了重建物体图像的质量,并放宽了对位置精度的要求。