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界面效应对聚合物电解质薄膜表面形貌和质子传导的影响。

Effect of interface on surface morphology and proton conduction of polymer electrolyte thin films.

机构信息

National Institute of Advanced Industrial Science and Technology (AIST), 1-8-31, Midorigaoka, Ikeda, Osaka 563-8577, Japan.

出版信息

Phys Chem Chem Phys. 2013 Jul 21;15(27):11494-500. doi: 10.1039/c3cp51136g. Epub 2013 Jun 10.

DOI:10.1039/c3cp51136g
PMID:23748745
Abstract

To understand the relationship between surface morphology and proton conduction of polymer electrolyte thin films, perfluorinated ionomer Nafion® thin films were prepared on different substrates such as glassy carbon (GC), hydrophilic-GC (H-GC), and platinum (Pt) as models for the ionomer film within a catalyst layer. Atomic force microscopy coupled with an electrochemical (e-AFM) technique revealed that proton conduction decreased with film thickness; an abrupt decrease in proton conductance was observed when the film thickness was less than ca. 10 nm on GC substrates in addition to a significant change in surface morphology. Furthermore, thin films prepared on H-GC substrates with UV-ozone treatment exhibited higher proton conduction than those on untreated GC substrates. However, Pt substrates exhibited proton conduction comparable to that of GCs for films thicker than 20 nm; a decrease in proton conduction was observed at ∼5 nm thick film but was still much higher than for carbon substrates. These results indicate that the number of active proton-conductive pathways and/or the connectivity of the proton path network changed with film thickness. The surface morphology of thinner films was significantly affected by the film/substrate interface and was fundamentally different from that of the bulk thick membrane.

摘要

为了理解聚合物电解质薄膜表面形貌与质子传导之间的关系,以玻璃碳(GC)、亲水 GC(H-GC)和铂(Pt)等不同基底上制备的全氟离子交换树脂 Nafion®薄膜作为催化剂层内的离聚物膜模型。原子力显微镜结合电化学(e-AFM)技术表明,质子传导随薄膜厚度的增加而降低;在 GC 基底上,当薄膜厚度小于约 10nm 时,质子传导会急剧下降,同时表面形貌也会发生显著变化。此外,经 UV-臭氧处理的 H-GC 基底上制备的薄膜比未经处理的 GC 基底上的薄膜具有更高的质子传导性。然而,对于厚度大于 20nm 的薄膜,Pt 基底上的质子传导性与 GC 基底相当;在约 5nm 厚的薄膜中观察到质子传导性下降,但仍远高于碳基底。这些结果表明,质子传导活性途径的数量和/或质子路径网络的连通性随薄膜厚度而变化。较薄薄膜的表面形貌受薄膜/基底界面的显著影响,与块状厚膜的表面形貌有根本的不同。

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