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利用斯托克斯矢量分辨二次谐波产生显微镜揭示分子结构和取向。

Revealing molecular structure and orientation with Stokes vector resolved second harmonic generation microscopy.

作者信息

Mazumder Nirmal, Hu Chih-Wei, Qiu Jianjun, Foreman Matthew R, Romero Carlos Macías, Török Peter, Kao Fu-Jen

机构信息

Institute of Biophotonics, National Yang-Ming University, Taipei 11221, Taiwan, ROC.

Blackett Laboratory, Department of Physics, Imperial College London, Prince Consort Road, London SW7 2BZ, UK; Max Planck Institute for the Science of Light, Günther-Scharowsky-Straße 1, 91058 Erlangen, Germany.

出版信息

Methods. 2014 Mar 15;66(2):237-45. doi: 10.1016/j.ymeth.2013.07.019. Epub 2013 Jul 25.

Abstract

We report on measurements and characterization of polarization properties of Second Harmonic (SH) signals using a four-channel photon counting based Stokes polarimeter. In this way, the critical polarization parameters can be obtained concurrently without the need of repeated image acquisition. The critical polarization parameters, including the degree of polarization (DOP), the degree of linear polarization (DOLP), and the degree of circular polarization (DOCP), are extracted from the reconstructed Stokes vector based SH images in a pixel-by-pixel manner. The measurements are further extended by varying the polarization states of the incident light and recording the resulting Stokes parameters of the SH signal. In turn this allows the molecular structure and orientation of the samples to be determined. Use of Stokes polarimetry is critical in determination of the full polarization state of light, and enables discrimination of material properties not possible with conventional crossed-polarized detection schemes. The combination of SHG microscopy and Stokes polarimeter hence makes a powerful tool to investigate the structural order of targeted specimens.

摘要

我们报告了使用基于四通道光子计数的斯托克斯偏振仪对二次谐波(SH)信号的偏振特性进行的测量和表征。通过这种方式,可以同时获得关键的偏振参数,而无需重复图像采集。关键的偏振参数,包括偏振度(DOP)、线偏振度(DOLP)和圆偏振度(DOCP),以逐像素的方式从基于斯托克斯矢量重建的SH图像中提取。通过改变入射光的偏振态并记录SH信号的斯托克斯参数,进一步扩展了测量。这反过来又可以确定样品的分子结构和取向。斯托克斯偏振测量法对于确定光的全偏振态至关重要,并且能够区分传统交叉偏振检测方案无法实现的材料特性。因此,SHG显微镜和斯托克斯偏振仪的结合成为研究目标样本结构顺序的强大工具。

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