Institute of Physics and Applied Physics, Yonsei University, Seoul 120-749, Korea.
Nanoscale. 2013 Oct 7;5(19):8915-20. doi: 10.1039/c3nr01847d. Epub 2013 Aug 14.
A palladium (Pd) nanogap-based thin-film has been connected to an electrically stable amorphous InGaZnO thin-film transistor, to form a hydrogen sensor demonstrating a dramatic sensing capability. As a result of the Pd connection to the transistor source, our sensor circuit greatly enhances the hydrogen-induced signal and sensing speed in the sense of output voltage, clearly resolving a minimum hydrogen content of 0.05%. When the nanogap-based Pd thin-film was connected to the transistor gate, an extremely limited hydrogen content of even less than 0.05% was visibly detected through gate voltage shifts. Our results exhibit the most promising and practical ways to sense extremely limited hydrogen contents, originating from two methods: transistor-to-Pd nanogap resistor and transistor-to-Pd nanogap capacitor coupling.
钯 (Pd) 纳米间隙基薄膜与电稳定非晶态 InGaZnO 薄膜晶体管相连,形成了一种具有显著传感性能的氢气传感器。由于 Pd 与晶体管源极相连,我们的传感器电路大大增强了氢诱导信号和传感速度,在输出电压方面,可清晰分辨出最小氢气含量为 0.05%。当基于纳米间隙的 Pd 薄膜连接到晶体管栅极时,通过栅极电压的变化,可以明显检测到甚至低于 0.05%的极低氢气含量。我们的研究结果展示了最有前途和实用的方法来感应极低的氢气含量,这源于两种方法:晶体管至 Pd 纳米间隙电阻器和晶体管至 Pd 纳米间隙电容器耦合。