Materials Science and Engineering Division, Material Measurement Laboratory, National Institute of Standards and Technology , Gaithersburg, Maryland 20899, United States.
ACS Appl Mater Interfaces. 2013 Sep 25;5(18):9120-7. doi: 10.1021/am402507f. Epub 2013 Sep 10.
This paper details the use of scanning photocurrent microscopy to examine localized current collection efficiency of thin-film photovoltaic devices with in-plane patterning at a submicrometer length scale. The devices are based upon two interdigitated comb electrodes at the micrometer length scale prepatterned on a substrate, with CdSe electrodeposited on one electrode and CdTe deposited over the entire surface of the resulting structure by pulsed laser deposition. Photocurrent maps provide information on what limits the performance of the windowless CdSe/CdTe thin-film photovoltaic devices, revealing "dead zones" particularly above the electrodes contacting the CdTe which is interpreted as recombination over the back contact. Additionally, the impact of ammonium sulfide passivation is examined, which enables device efficiency to reach 4.3% under simulated air mass 1.5 illumination.
本文详细介绍了扫描光电电流显微镜在亚微米长度尺度上对具有面内图案的薄膜光伏器件局部电流收集效率的检测应用。该器件基于在衬底上预先图案化的微米长度尺度的两个叉指梳状电极,在一个电极上电沉积 CdSe,在整个结构表面上通过脉冲激光沉积沉积 CdTe。光电流图提供了关于限制无窗 CdSe/CdTe 薄膜光伏器件性能的信息,揭示了“死区”,特别是在与 CdTe 接触的电极上方,这被解释为背接触处的复合。此外,还研究了硫化铵钝化的影响,它使器件在模拟大气质量 1.5 照明下的效率达到 4.3%。