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6 MeV H+辐照水热 ZnO 单晶体的缺陷。

Defects in 6 MeV H+ irradiated hydrothermal ZnO single crystal.

机构信息

Department of Physics, Bangabasi Morning College, 19 Rajkumar Chakraborty Sarani, Kolkata 700 009, India.

出版信息

J Phys Condens Matter. 2013 Sep 25;25(38):385501. doi: 10.1088/0953-8984/25/38/385501. Epub 2013 Aug 29.

Abstract

The effect of 6 MeV H(+) irradiation on hydrothermally grown ZnO single crystal has been investigated using high resolution x-ray diffraction (HRXRD) and optical absorption (ultraviolet-visible) spectroscopy. The increase of the diffuse scattering in the reciprocal space maps measured using HRXRD indicates an increase of the point defect density upon irradiation. Within the penetration depth of x-rays of several micrometres, the defect density increased with increasing distance from the sample surface. On the other hand, the near band gap optical absorption became sharper for the irradiated crystal. This reflects enhanced band to band absorption and reduced sub-band gap absorption due to defects. Temperature dependent photoluminescence spectra of the pristine sample show negative thermal quenching (NTQ) of the luminescence which is due to the presence of two or more donor related defects. Upon irradiation, a single dominant donor bound transition can be found without any temperature induced NTQ. Enhancement of the band edge luminescence and reduction of the defect related luminescence is observed at 10 K. Such changes have been discussed in the light of the hydrogen present in the as-grown state of hydrothermal ZnO.

摘要

采用高分辨率 X 射线衍射(HRXRD)和光学吸收(紫外可见)光谱研究了 6 MeV H(+)辐照对水热生长 ZnO 单晶的影响。HRXRD 测量的倒易空间图谱中漫散射的增加表明辐照后点缺陷密度增加。在 X 射线的穿透深度为几微米的范围内,缺陷密度随距样品表面距离的增加而增加。另一方面,辐照晶体的近带隙光吸收变得更加尖锐。这反映了由于缺陷导致的带间吸收增强和亚带隙吸收减少。原始样品的温度依赖光致发光谱显示出发光的负热猝灭(NTQ),这是由于存在两个或更多施主相关缺陷。辐照后,在没有任何温度诱导 NTQ 的情况下,可以发现单个主导施主束缚跃迁。在 10 K 时观察到带边发光的增强和缺陷相关发光的减少。这些变化是根据水热 ZnO 生长状态中存在的氢来讨论的。

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