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V 通道锗(220)单色仪在 X 射线计量学和成像中的潜在应用。

Potential use of V-channel Ge(220) monochromators in X-ray metrology and imaging.

作者信息

Korytár D, Vagovič P, Végsö K, Siffalovič P, Dobročka E, Jark W, Ač V, Zápražný Z, Ferrari C, Cecilia A, Hamann E, Mikulík P, Baumbach T, Fiederle M, Jergel M

机构信息

Institute of Electrical Engineering, SAS, Dúbravská cesta 9, 841 04 Bratislava, Slovakia.

出版信息

J Appl Crystallogr. 2013 Aug 1;46(Pt 4):945-952. doi: 10.1107/S0021889813006122. Epub 2013 Jun 7.

Abstract

While channel-cut crystals, in which the diffracting surfaces in an asymmetric cut are kept parallel, can provide beam collimation and spectral beam shaping, they can in addition provide beam compression or expansion if the cut is V-shaped. The compression/expansion ratio depends in this case on the total asymmetry factor. If the Ge(220) diffraction planes and a total asymmetry factor in excess of 10 are used, the rocking curves of two diffractors will have a sufficient overlap only if the second diffractor is tuned slightly with respect to the first one. This study compares and analyses several ways of overcoming this mismatch, which is due to refraction, when the Cu α beam is compressed 21-fold in a V21 monochromator. A more than sixfold intensity increase was obtained if the matching was improved either by a compositional variation or by a thermal deformation. This provided an intensity gain compared with the use of a simple slit in a symmetrical channel-cut monochromator. The first attempt to overcome the mismatch by introducing different types of X-ray prisms for the required beam deflection is described as well. The performance of the V-shaped monochromators is demonstrated in two applications. A narrow collimated monochromatic beam obtained in the beam compressing mode was used for high-resolution grazing-incidence small-angle X-ray scattering measurements of a silicon sample with corrupted surface. In addition, a two-dimensional Bragg magnifier, based on two crossed V15 channel monochromators in beam expansion mode and tuned by means of unequal asymmetries, was successfully applied to high-resolution imaging of test structures in combination with a Medipix detector.

摘要

虽然通道切割晶体(其中非对称切割中的衍射面保持平行)可以提供光束准直和光谱光束整形,但如果切割为V形,它们还可以提供光束压缩或扩展。在这种情况下,压缩/扩展比取决于总不对称因子。如果使用Ge(220)衍射平面和超过10的总不对称因子,则只有当第二个衍射器相对于第一个衍射器稍微调谐时,两个衍射器的摇摆曲线才会有足够的重叠。本研究比较并分析了几种克服这种失配的方法,这种失配是由于折射引起的,当Cu α光束在V21单色仪中被压缩21倍时。如果通过成分变化或热变形改善匹配,则强度增加超过六倍。与在对称通道切割单色仪中使用简单狭缝相比,这提供了强度增益。还描述了首次尝试通过引入不同类型的X射线棱镜来实现所需的光束偏转以克服失配。在两个应用中展示了V形单色仪的性能。在光束压缩模式下获得的窄准直单色光束用于对表面受损的硅样品进行高分辨率掠入射小角X射线散射测量。此外,基于两个交叉的处于光束扩展模式且通过不等不对称性调谐的V15通道单色仪的二维布拉格放大镜,与Medipix探测器结合成功应用于测试结构的高分辨率成像。

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