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核心离化光电子能谱中揭示的近边 X 射线吸收精细结构。

Near-edge x-ray absorption fine structures revealed in core ionization photoelectron spectroscopy.

机构信息

Department of Chemistry, Tokyo Institute of Technology, Tokyo 152855, Japan and Institute of Material Structural Science, Photon Factory, Tsukuba, Ibaraki 3050801, Japan.

出版信息

Phys Rev Lett. 2013 Sep 20;111(12):123001. doi: 10.1103/PhysRevLett.111.123001.

Abstract

Simultaneous core ionization and core excitation have been observed in the C(2)H(2n) (n=1, 2, 3) molecular series using synchrotron radiation and a magnetic bottle time-of-flight electron spectrometer. Rich satellite patterns corresponding to (K(-2)V) core excited states of the K(-1) molecular ions have been identified by detecting in coincidence the photoelectron with the two Auger electrons resulting from the double core hole relaxation. A theoretical model is proposed providing absolute photoionization cross sections and revealing clear signatures of direct (monopolar) and conjugate (dipolar near-edge x-ray absorption fine structure) shakeup lines of comparable magnitude.

摘要

利用同步辐射和磁瓶飞行时间电子能谱仪,在 C(2)H(2n) (n=1, 2, 3) 分子系列中观察到了 C(2)H(2n) (n=1, 2, 3) 分子系列中同时的核心离化和核心激发。通过同时检测光电电子和双核心孔弛豫产生的两个俄歇电子,识别出与 K(-1)分子离子的 (K(-2)V) 核心激发态相对应的丰富卫星图案。提出了一个理论模型,提供了绝对光离子化截面,并揭示了直接(单极)和共轭(近边缘 X 射线吸收精细结构偶极子) shakeup 线的清晰特征,其大小相当。

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