Key Laboratory of Material Physics, Anhui Key Laboratory of Nanomaterials and Nanotechnology, Institute of Solid State Physics, Chinese Academy of Sciences, Hefei, China.
Nanoscale. 2013 Dec 7;5(23):11643-8. doi: 10.1039/c3nr81284g.
Understanding and measuring the size-dependent surface strain of nanowires are essential to their applications in various emerging devices. Here, we report on the diameter-dependent surface strain and Young's modulus of single-crystalline Co nanowires investigated by in situ X-ray diffraction measurements. Diameter-dependent initial longitudinal elongation of the nanowires is observed and ascribed to the anisotropic surface stress due to the Poisson effect, which serves as the basis for mechanical measurements. As the nanowire diameter decreases, a transition from the "smaller is softer" regime to the "smaller is tougher" regime is observed in the Young's modulus of the nanowires, which is attributed to the competition between the elongation softening and the surface stiffening effects. Our work demonstrates a new nondestructive method capable of measuring the initial surface strain and estimating the Young's modulus of single crystalline nanowires, and provides new insights on the size effect.
了解和测量纳米线的尺寸相关表面应变对于它们在各种新兴器件中的应用至关重要。在这里,我们通过原位 X 射线衍射测量报告了单晶 Co 纳米线的直径相关表面应变和杨氏模量。观察到纳米线直径相关的初始纵向伸长,这归因于泊松效应引起的各向异性表面应力,这是机械测量的基础。随着纳米线直径的减小,纳米线的杨氏模量从“较小的更软”转变为“较小的更坚韧”,这归因于伸长软化和表面硬化效应之间的竞争。我们的工作展示了一种新的无损方法,能够测量单晶纳米线的初始表面应变并估计其杨氏模量,并为尺寸效应提供了新的见解。