Department of Physics, Jamia Millia Islamia, New Delhi 110025, India.
Nanoscale Res Lett. 2013 Oct 18;8(1):433. doi: 10.1186/1556-276X-8-433.
We report the growth and characterization of uniform-sized nanoparticles of cobalt on n-type silicon (100) substrates by swift heavy ion (SHI) irradiation. The Co thin films of 25-nm thicknesses were grown by e-beam evaporation and irradiated with two different types of ions, 45-MeV Li3+ and 100-MeV O7+ ions with fluences ranging from 1 × 1011 to 1 × 1013 ions/cm2. SHI irradiation, with the beam rastered over the area of the film, resulted in the restructuring of the film into a dense array of Co nanostructures. Surface topography studied by atomic force microscopy revealed narrowed size distributions, with particle sizes ranging from 20 to 50 nm, formed through a self-organized process. Ion fluence-dependent changes in crystallinity of the Co nanostructures were determined by glancing angle X-ray diffraction. Rutherford backscattering spectroscopy analysis showed the absence of beam-induced mixing in this system. Surface restructuring and beam-induced crystallization are the dominant effects, with the nanoparticle size and density being dependent on the ion fluence. Results are analyzed in the context of molecular dynamics calculations of electron-lattice energy transfer.
我们通过 swift 重离子(SHI)辐照报告了在 n 型硅(100)衬底上生长均匀尺寸的钴纳米粒子及其特性。Co 薄膜通过电子束蒸发生长,厚度为 25nm,并使用两种不同类型的离子(45-MeV Li3+ 和 100-MeV O7+)进行辐照,离子通量范围为 1×1011 至 1×1013 离子/cm2。辐照时,将光束扫描过薄膜的整个区域,导致薄膜重构为密集排列的 Co 纳米结构。原子力显微镜研究的表面形貌显示,通过自组织过程形成了粒径为 20 至 50nm 的更窄的粒径分布。通过掠角 X 射线衍射确定了 Co 纳米结构的结晶度随离子通量的变化。卢瑟福背散射光谱分析表明,在该系统中不存在束致混合。表面重构和束致结晶是主要效应,纳米粒子的尺寸和密度取决于离子通量。结果是在电子-晶格能量转移的分子动力学计算的背景下进行分析的。