School of Chemistry, University of New South Wales, 2052, Sydney, Australia.
J Am Soc Mass Spectrom. 1994 Aug;5(8):772-8. doi: 10.1016/1044-0305(94)80010-3.
Recent and ongoing advances in timing electronics together with the development of ionization techniques suited to time-of-flight mass spectrometry (TOF-MS) have contributed to renewed interest in this method of mass analysis. Whereas low resolving powers (m/†m < 500) were once an almost unavoidable drawback in TOF-MS, recent developments in instrument geometries have produced much higher resolving powers for many ion sources. The temporal width of detector pulses and jitter in timing electronics, however, lead to contributions to peak widths that are essentially independent of the mass-analyzer ion optics. The effective detector pulse width (†t d ≈ 1-10 ns typically) can be a limiting factor in the development of high resolution time-of-flight (TOF) instruments with modest drift lengths (∼1 m), It also reduces the mass resolution more seriously for light ions. This article presents a method for distinguishing the instrumental "ion arrival-time" resolution (R o) of a linear TOF mass analyzer from that which is locally measured at a particular mass, limited by the broadening of the detector pulse width and electronics. The method also provides an estimate of †t d, that is useful in determining the temporal performance of the detection system. The model developed here is tested with data from a recently constructed orthogonal-acceleration TOF mass spectrometer equipped with a commercially available transient recorder (a LeCroy 400-Msamplejs digital oscilloscope) from which we obtained R o = 4240 ± 100 [full width at half maximum (FWHM)) and †t d = 3.0 ± 0.1 ns (FWHM).
近年来,计时电子学的进步以及适合飞行时间质谱(TOF-MS)的离子化技术的发展,使得人们对这种质量分析方法重新产生了兴趣。虽然在 TOF-MS 中,低分辨率(m/Δm<500)曾经是一个几乎不可避免的缺点,但仪器几何形状的最新发展为许多离子源产生了更高的分辨率。然而,探测器脉冲的时间宽度和计时电子学中的抖动会导致峰宽的贡献基本上与质量分析器离子光学无关。有效探测器脉冲宽度(Δt d≈1-10ns 通常)可能是在具有适度漂移长度(约 1m)的高分辨率飞行时间(TOF)仪器的发展中的一个限制因素。对于轻离子,它也会更严重地降低质量分辨率。本文提出了一种方法,用于区分线性 TOF 质量分析仪的仪器“离子到达时间”分辨率(R o)与在特定质量处局部测量的分辨率,该分辨率受探测器脉冲宽度和电子学的展宽限制。该方法还提供了对 Δt d 的估计,这对于确定检测系统的时间性能很有用。这里开发的模型用最近构建的正交加速 TOF 质谱仪的数据进行了测试,该质谱仪配备了商用瞬态记录仪(LeCroy 400-Msamplejs 数字示波器),从中我们获得了 R o=4240±100[半峰全宽(FWHM)]和 Δt d=3.0±0.1ns(FWHM)。