Maire Guillaume, Ruan Yi, Zhang Ting, Chaumet Patrick C, Giovannini Hugues, Sentenac Daniel, Talneau Anne, Belkebir Kamal, Sentenac Anne
J Opt Soc Am A Opt Image Sci Vis. 2013 Oct 1;30(10):2133-9. doi: 10.1364/JOSAA.30.002133.
Tomographic diffractive microscopy (TDM) is a label-free imaging technique that reconstructs the 3D refractive index map of the probed object with an improved resolution compared to confocal microscopy. In this work, we consider a TDM implementation in which the sample is deposited on a reflective substrate. We show that this configuration requires calibration and inversion procedures that account for the presence of the substrate for getting highly resolved quantitative reconstructions.
层析衍射显微镜（TDM）是一种无标记成像技术，与共聚焦显微镜相比，它能以更高的分辨率重建被探测物体的三维折射率图。在这项工作中，我们考虑一种TDM实现方式，即把样品沉积在反射基板上。我们表明，这种配置需要校准和反演程序，以考虑基板的存在，从而获得高分辨率的定量重建结果。
