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硅(100)上垂直 III-V 纳米线器件的集成。

Vertical III-V nanowire device integration on Si(100).

机构信息

IBM Research-Zurich , Säumerstrasse 4, 8803, Rüschlikon, Switzerland.

出版信息

Nano Lett. 2014;14(4):1914-20. doi: 10.1021/nl404743j. Epub 2014 Mar 19.

Abstract

We report complementary metal-oxide-semiconductor (CMOS)-compatible integration of compound semiconductors on Si substrates. InAs and GaAs nanowires are selectively grown in vertical SiO2 nanotube templates fabricated on Si substrates of varying crystallographic orientations, including nanocrystalline Si. The nanowires investigated are epitaxially grown, single-crystalline, free from threading dislocations, and with an orientation and dimension directly given by the shape of the template. GaAs nanowires exhibit stable photoluminescence at room temperature, with a higher measured intensity when still surrounded by the template. Si-InAs heterojunction nanowire tunnel diodes were fabricated on Si(100) and are electrically characterized. The results indicate a high uniformity and scalability in the fabrication process.

摘要

我们报告了在 Si 衬底上实现的互补金属氧化物半导体(CMOS)兼容的化合物半导体集成。在 Si 衬底上制造的不同晶体取向的垂直 SiO2 纳米管模板中,选择性地生长了 InAs 和 GaAs 纳米线,包括纳米晶 Si。所研究的纳米线是外延生长的、单晶的、无位错的,并且其取向和尺寸直接由模板的形状决定。GaAs 纳米线在室温下表现出稳定的光致发光,当仍被模板包围时,其测量强度更高。在 Si(100)上制造了 Si-InAs 异质结纳米线隧道二极管,并对其进行了电特性表征。结果表明,该制造工艺具有高度的均匀性和可扩展性。

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