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Zn-21Al-2Cu 合金的电子背散射衍射(EBSD)分析的金相制备。

Metallographic preparation of Zn-21Al-2Cu alloy for analysis by electron backscatter diffraction (EBSD).

机构信息

1Facultad de Ingeniería,Universidad Autónoma de San Luis Potosí,San Luis Potosí,San Luis Potosí,78290,México.

2Instituto de Investigaciones en Materiales,Universidad Nacional Autónoma de México,D. F.,04519,México.

出版信息

Microsc Microanal. 2014 Aug;20(4):1276-83. doi: 10.1017/S1431927614000397. Epub 2014 Mar 31.

DOI:10.1017/S1431927614000397
PMID:24685337
Abstract

Samples of Zn-21Al-2Cu alloy (Zinalco) that will be heavily deformed were prepared using five different manual mechanical metallographic methods. Samples were analyzed before tensile testing using the orientation imaging microscopy-electron backscatter diffraction (OIM-EBSD) technique. The effect of type and particle size during the final polishing stages for this material were studied in order to identify a method that produces a flat, damage free surface with a roughness of about 50 nm and clean from oxide layers, thereby producing diffraction patterns with high image quality (IQ) and adequate confidence indexes (CI). Our results show that final polishing with alumina and silica, as was previously suggested by other research groups for alloys that are difficult to prepare or alloys with low melting point, are not suitable for manual metallographic preparation of this alloy. Indexes of IQ and CI can be used to evaluate methods of metallographic preparation of samples studied using the OIM-EBSD technique.

摘要

使用五种不同的手动机械金相方法制备了将进行剧烈变形的 Zn-21Al-2Cu 合金(Zinalco)样品。在进行拉伸试验之前,使用取向成像显微镜-电子背散射衍射(OIM-EBSD)技术对样品进行了分析。研究了最终抛光阶段中材料的类型和颗粒大小对其的影响,以确定一种能够产生具有约 50nm 粗糙度和平整、无损伤表面的方法,并清除氧化物层,从而产生具有高图像质量(IQ)和足够置信指数(CI)的衍射图案。我们的结果表明,对于难以制备或熔点低的合金,之前有研究小组建议使用氧化铝和二氧化硅进行最终抛光,但这不适用于手动金相制备这种合金。IQ 和 CI 指数可用于评估使用 OIM-EBSD 技术研究的样品金相制备方法。

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