Materials and Mining Engineering Department, McGill University, 3610 University Street, Montreal, Quebec H3A2B2, Canada.
Microsc Microanal. 2011 Jun;17(3):374-85. doi: 10.1017/S1431927611000456. Epub 2011 May 6.
An open source software package dedicated to processing stored electron backscatter patterns is presented. The package gives users full control over the type and order of operations that are performed on electron backscatter diffraction (EBSD) patterns as well as the results obtained. The current version of EBSD-Image (www.ebsd-image.org) offers a flexible and structured interface to calculate various quality metrics over large datasets. It includes unique features such as practical file formats for storing diffraction patterns and analysis results, stitching of mappings with automatic reorganization of their diffraction patterns, and routines for processing data on a distributed computer grid. Implementations of the algorithms used in the software are described and benchmarked using simulated diffraction patterns. Using those simulated EBSD patterns, the detection of Kikuchi bands in EBSD-Image was found to be comparable to commercially available EBSD systems. In addition, 24 quality metrics were evaluated based on the ability to assess the level of deformation in two samples (copper and iron) deformed using 220 grit SiC grinding paper. Fourteen metrics were able to properly measure the deformation gradient of the samples.
本文介绍了一个专注于处理存储电子背散射花样的开源软件包。该软件包为用户提供了对电子背散射衍射（EBSD）花样以及获得的结果执行的操作类型和顺序的完全控制。当前版本的 EBSD-Image（www.ebsd-image.org）提供了一种灵活且结构化的接口，可针对大型数据集计算各种质量指标。它包括实用的文件格式，用于存储衍射花样和分析结果，映射的拼接以及其衍射花样的自动重新组织，以及用于在分布式计算机网格上处理数据的例程。本文描述了所使用的算法的实现，并使用模拟的衍射花样对其进行了基准测试。使用那些模拟的 EBSD 花样，发现 EBSD-Image 中的菊池带检测与商业可用的 EBSD 系统相当。此外，基于评估使用 220 粒度 SiC 砂纸变形的两个样品（铜和铁）的变形程度的能力，评估了 24 个质量指标。有 14 个指标能够正确测量样品的变形梯度。
