Department of Analytical Chemistry, University of the Basque Country UPV/EHU, P.O. Box 644, E-48080 Bilbao, Basque Country, Spain.
Department of Analytical Chemistry, University of the Basque Country UPV/EHU, P.O. Box 644, E-48080 Bilbao, Basque Country, Spain.
Spectrochim Acta A Mol Biomol Spectrosc. 2014 Aug 14;129:259-67. doi: 10.1016/j.saa.2014.03.096. Epub 2014 Apr 3.
This work studies the applicability of a Diffuse Reflectance Infrared Fourier Transform handheld device to perform in situ analyses on Cultural Heritage assets. This portable diffuse reflectance spectrometer has been used to characterise and diagnose the conservation state of (a) building materials of the Guevara Palace (15th century, Segura, Basque Country, Spain) and (b) different 19th century wallpapers manufactured by the Santa Isabel factory (Vitoria-Gasteiz, Basque Country, Spain) and by the well known Dufour and Leroy manufacturers (Paris, France), all of them belonging to the Torre de los Varona Castle (Villanañe, Basque Country, Spain). In all cases, in situ measurements were carried out and also a few samples were collected and measured in the laboratory by diffuse reflectance spectroscopy (DRIFT) in order to validate the information obtained by the handheld instrument. In the analyses performed in situ, distortions in the diffuse reflectance spectra can be observed due to the presence of specular reflection, showing the inverted bands caused by the Reststrahlen effect, in particular on those IR bands with the highest absorption coefficients. This paper concludes that the results obtained in situ by a diffuse reflectance handheld device are comparable to those obtained with laboratory diffuse reflectance spectroscopy equipment and proposes a few guidelines to acquire good spectra in the field, minimising the influence caused by the specular reflection.
本工作研究了漫反射红外傅里叶变换手持设备在文化遗产资产原位分析中的适用性。该便携式漫反射光谱仪已用于对（a）格瓦拉宫（15 世纪，西班牙塞古拉，巴斯克地区）的建筑材料和（b）不同的 19 世纪壁纸进行特征描述和保存状态诊断，这些壁纸由圣伊莎贝尔工厂（西班牙维多利亚-加斯泰兹，巴斯克地区）以及著名的杜富尔和勒罗伊制造商（法国巴黎）制造，均属于维拉纳内的沃罗纳城堡（西班牙巴斯克地区）。在所有情况下，均进行了原位测量，并采集了一些样本在实验室中通过漫反射光谱（DRIFT）进行测量，以验证手持仪器获得的信息。在进行的原位分析中，由于镜面反射的存在，可以观察到漫反射光谱的扭曲，显示出由于瑞利散射效应引起的倒置带，特别是在那些具有最高吸收系数的红外波段。本文得出结论，通过漫反射手持设备获得的现场结果与通过实验室漫反射光谱仪设备获得的结果相当，并提出了一些在现场获取良好光谱的指南，最大程度地减少镜面反射的影响。
