School of Materials Science and Engineering and ‡George W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology , Atlanta, Georgia 30332, United States.
J Am Chem Soc. 2014 May 7;136(18):6546-9. doi: 10.1021/ja5005416. Epub 2014 Apr 29.
We report continuous monitoring of heterogeneously distributed oxygenated functionalities on the entire surface of the individual graphene oxide flake during the chemical reduction process. The charge densities over the surface with mixed oxidized and graphitic domains were observed for the same flake after a step-by-step chemical reduction process using electrostatic force microscopy. Quantitative analysis revealed heavily oxidized nanoscale domains (50-100 nm across) on the graphene oxide surface and a complex reduction mechanism involving leaching of sharp oxidized asperities from the surface followed by gradual thinning and formation of uniformly mixed oxidized and graphitic domains across the entire flake.
我们报告了在化学还原过程中对单个氧化石墨烯片整个表面上不均匀分布的含氧官能团的连续监测。通过使用静电力显微镜对逐步化学还原过程后的同一薄片进行观察，我们发现表面上具有混合氧化和石墨化区域的电荷密度。定量分析揭示了氧化石墨烯表面上的高度氧化纳米尺度域（直径为 50-100nm），以及涉及从表面浸出尖锐氧化突起物，然后逐渐变薄并在整个薄片上形成均匀混合的氧化和石墨化域的复杂还原机制。
