基于表面粘附力测量的介电特性纳米级映射。
Nanoscale mapping of dielectric properties based on surface adhesion force measurements.
作者信息
Wang Ying, Shen Yue, Wang Xingya, Shen Zhiwei, Li Bin, Hu Jun, Zhang Yi
机构信息
Key Laboratory of Interfacial Physics and Technology and Laboratory of Physical Biology, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China.
Key Laboratory of Salt Lake Resources Chemistry of Qinghai Province, Qinghai Institute of Salt Lakes, Chinese Academy of Sciences, Xining, Qinghai 810008, China.
出版信息
Beilstein J Nanotechnol. 2018 Mar 16;9:900-906. doi: 10.3762/bjnano.9.84. eCollection 2018.
The detection of local dielectric properties is of great importance in a wide variety of scientific studies and applications. Here, we report a novel method for the characterization of local dielectric distributions based on surface adhesion mapping by atomic force microscopy (AFM). The two-dimensional (2D) materials graphene oxide (GO), and partially reduced graphene oxide (RGO), which have similar thicknesses but large differences in their dielectric properties, were studied as model systems. Through direct imaging of the samples with a biased AFM tip in PeakForce Quantitative Nano-Mechanics (PF-QNM) mode, the local dielectric properties of GO and RGO were revealed by mapping their surface adhesion forces. Thus, GO and RGO could be conveniently differentiated. This method provides a simple and general approach for the fast characterization of the local dielectric properties of graphene-based materials and will further facilitate their applications in energy generation and storage devices.
在众多科学研究和应用中，检测局部介电特性具有至关重要的意义。在此，我们报告一种基于原子力显微镜（AFM）表面粘附力映射来表征局部介电分布的新方法。研究了具有相似厚度但介电特性差异很大的二维（2D）材料氧化石墨烯（GO）和部分还原氧化石墨烯（RGO）作为模型系统。通过在PeakForce定量纳米力学（PF-QNM）模式下用带偏置的AFM探针直接对样品成像，通过绘制其表面粘附力来揭示GO和RGO的局部介电特性。因此，GO和RGO能够方便地加以区分。该方法为快速表征基于石墨烯的材料的局部介电特性提供了一种简单通用的方法，并将进一步促进它们在能量产生和存储设备中的应用。
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