Martin Andrew V
ARC Centre of Excellence for Coherent X-ray Science, School of Physics, The University of Melbourne, Melbourne, Victoria 3010, Australia
Philos Trans R Soc Lond B Biol Sci. 2014 Jul 17;369(1647):20130329. doi: 10.1098/rstb.2013.0329.
A statistical model for X-ray scattering of a non-periodic sample to high angles is introduced. It is used to calculate analytically the correlation of distinct diffraction measurements of a particle as a continuous function of particle orientation. Diffraction measurements with shot-noise are also considered. This theory provides a general framework for a deeper understanding of single particle imaging techniques used at X-ray free-electron lasers. Many of these techniques use correlations as a measure of diffraction-pattern similarity in order to determine properties of the sample, such as particle orientation.
介绍了一种用于非周期性样品X射线高角度散射的统计模型。它用于解析计算作为粒子取向连续函数的粒子不同衍射测量值之间的相关性。还考虑了具有散粒噪声的衍射测量。该理论为更深入理解X射线自由电子激光中使用的单粒子成像技术提供了一个通用框架。这些技术中的许多都使用相关性作为衍射图案相似性的度量，以便确定样品的性质，例如粒子取向。
