Kassemeyer Stephan, Jafarpour Aliakbar, Lomb Lukas, Steinbrener Jan, Martin Andrew V, Schlichting Ilme
Max-Planck-Institut für medizinische Forschung, Jahnstr. 29, 69120 Heidelberg and Max Planck Advanced Study Group, Center for Free-Electron Laser Science (CFEL), Notkestr. 85, 22607 Hamburg, Germany.
Phys Rev E Stat Nonlin Soft Matter Phys. 2013 Oct;88(4):042710. doi: 10.1103/PhysRevE.88.042710. Epub 2013 Oct 28.
Coherent diffractive imaging with x-ray free-electron lasers (XFEL) promises high-resolution structure determination of noncrystalline objects. Randomly oriented particles are exposed to XFEL pulses for acquisition of two-dimensional (2D) diffraction snapshots. The knowledge of their orientations enables 3D imaging by multiview reconstruction, combining 2D diffraction snapshots in different orientations. Here we introduce a globally optimal algorithm that can infer these orientations. We apply it to experimental XFEL data of nanoparticles and so determine their 3D electron density.
利用X射线自由电子激光（XFEL）进行相干衍射成像有望实现对非晶态物体的高分辨率结构测定。随机取向的粒子暴露于XFEL脉冲下，以获取二维（2D）衍射快照。了解它们的取向可通过多视图重建实现三维成像，即将不同取向的二维衍射快照组合起来。在此，我们引入一种能推断这些取向的全局最优算法。我们将其应用于纳米粒子的实验XFEL数据，从而确定它们的三维电子密度。
